Product overview
- Product number
- SN74BCT8374ANTG4
- Manufacturer
- Texas Instruments
- Catalog
- Logic - Specialty Logic
- product description
- IC SCAN TEST DEVICE W/FF 24-DIP
Documents and media
- Datasheets
- SN74BCT8374ANTG4
Product Details
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Mounting Type :
- Through Hole
- Number of Bits :
- 8
- Operating Temperature :
- 0°C ~ 70°C
- Part Status :
- Obsolete
- Supplier Device Package :
- 24-PDIP
- Supply Voltage :
- 4.5V ~ 5.5V
product description
IC SCAN TEST DEVICE W/FF 24-DIP
