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Product overview

Product number
SN74BCT8240ANTG4
Manufacturer
Texas Instruments
Catalog
Logic - Specialty Logic
product description
IC SCAN TEST DEVICE BUFF 24-DIP

Documents and media

Datasheets
SN74BCT8240ANTG4

Product Details

Logic Type :
Scan Test Device with Inverting Buffers
Mounting Type :
Through Hole
Number of Bits :
8
Operating Temperature :
0°C ~ 70°C
Part Status :
Obsolete
Supplier Device Package :
24-PDIP
Supply Voltage :
4.5V ~ 5.5V

product description

IC SCAN TEST DEVICE BUFF 24-DIP

Purchases and prices

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