Product overview
- Product number
- SN74BCT8374ADWR
- Manufacturer
- Texas Instruments
- Catalog
- Logic - Specialty Logic
- product description
- IC SCAN TEST DEVICE W/FF 24-SOIC
Documents and media
- Datasheets
- SN74BCT8374ADWR
Product Details
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Mounting Type :
- Surface Mount
- Number of Bits :
- 8
- Operating Temperature :
- 0°C ~ 70°C
- Part Status :
- Obsolete
- Supplier Device Package :
- 24-SOIC
- Supply Voltage :
- 4.5V ~ 5.5V
product description
IC SCAN TEST DEVICE W/FF 24-SOIC
Purchases and prices
Recommended Products
You may be looking for
MS27468T21F11JB
M83723/74W24199
FW-05-01-F-D-650-100
MS3124F18-11P(LC)
0718505808
ESW-127-34-G-D
FW-05-02-F-D-250-070
CN0966B24S57P8Y040
PV70L18-32PL
MS27466T17F35PC
SFM-140-L2-F-D-LC
FW-04-03-F-D-200-085
D38999/26FJ29HN
FW-04-05-L-D-372-150
D38999/26KC98BN
304-11-129-41-780000
MS27468T21F11PA
M83723/74W2419N
FW-05-01-F-D-675-080
MS3451L40-9A
